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Patents for Brown & Sharpe Mfg. Co.
Patents 511 - 525 of 544
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NumberDatePatenteeTitleType
5,977,781Nov. 02, 1999P. JordilCapacitive Measuring Device
5,987,765Nov. 23, 1999R. Causarano, E. Garau, D. SolaReconfigurable Supporting Element, Particularly for Measured Parts on a Measuring Machine
6,072,318Jun. 06, 2000P. JordilCapacitive Device for Measuring Dimension
6,112,423Sep. 05, 2000K.L. SheehanApparatus and Method for Calibrating a Probe Assembly of a Measuring Machine
6,178,389Jan. 23, 2001D. Sola, B.I. Rebaglia, M.D. Ciommo, A. Balsamo, E. RicciMethod of Determining the Measuring Uncertainty of a Coordinate Measuring Devicecoordinate measuring machines
6,181,422Jan. 30, 2001J.A. VeltzeOptical Surface Measurement Apparatus and Methods
6,191,578Feb. 20, 2001J. Bolli, A. BezingeMagnetoresistive Sensor for High Precision Measurements of Lengths and Angles
6,208,912Mar. 27, 2001D. Sola, D. RussoAssembly for Connecting a Measuring Head to a Measuring Robot
6,229,301May 08, 2001P. Jordil, J. BolliElectronic Circuit and Method for a Dimension-Measuring Device
6,247,244Jun. 19, 2001M. Paudex, A. Bovey, A. ZanierDevice for Longitudinal Measurement
6,252,242Jun. 26, 2001E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir, A. BrunfieldHigh Speed Optical Inspection Apparatus Using Gaussian Distribution Analysis and Method Therefore
6,255,666Jul. 03, 2001E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir, A. BrunfieldHigh Speed Optical Inspection Apparatus for a Large Transparent Flat Panel Using Gaussian Distribution Analysis and Method Therefor
6,262,432Jul. 17, 2001E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir, A. BrunfieldHigh Speed Surface Inspection Optical Apparatus for a Reflective Disk Using Gaussian Distribution Analysis and Method Therefor
6,276,864Aug. 21, 2001D. Sola, D. RussoAssembly for Connecting a Measuring Tool to a Measuring Head Moved by a Measuring Robot
EP-1,111,347Sep. 05, 2001R. Duteil, M. CardilloPositional Encoder
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