| All Patents in class 33/504 |
Patents 1 -
9
of 9
      |
| Number | Title | Classification(s) |
| 4,118,871 | Binary Inspection Probe for Numerically Controlled Machine Tools | 318/16, 318/574, 33/504, 33/505, 700/195, 702/168 |
| 4,750,272 | Tool measuring device employing gap width detection | 33/201, 33/504, 33/558, 33/639, 33/833 |
| 4,833,630 | Method and Apparatus for the Tridimensional Measuring of an Object | 318/569, 318/575, 33/504, 700/195, 702/168 |
| 4,866,643 | Method for Automatic Compensation of Probe Offset in a Coordinate Measuring Machine | 33/504, 700/193, 700/195, 702/95 |
| 5,066,176 | Probe for Machine Tool | 33/504, 33/558, 33/638, 408/2, 409/133 |
| 5,778,548 | Viewing Device and Method for Three-Dimensional Noncontacting Measurements | 33/503, 33/504 |
| 5,883,313 | Part Measuring Gauge | 33/504, 33/552, 33/557, 33/560, 73/865.8 |
| 6,161,079 | Method and Apparatus for Determining Tolerance and Nominal Measurement Values for a Coordinate Measuring Machine | 33/503, 33/504, 33/505, 700/195, 702/168 |
| 6,952,883 | Dimension-Measuring Column and Method for Entering a Command to Switch the Measure Mode in Such a Column | 33/504, 33/542, 33/556, 33/559, 33/832 |
