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All Patents in class 33/831
Patents 31 - 39 of 39
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NumberDatePatenteeTitleType
6,260,286Jul. 17, 2001S. Takahashi, S. Hayashida, M. SuzukiMicrometermicrometers
6,308,433Oct. 30, 2001M. Tachikake, K. Sasak, S. Hayashida, T. Otsuka, T. Nakadoi, S. TakahashiMicrometer that Holds Displayed Displacement when Retraction Amount is Less than a Set Amountmicrometers
6,463,671Oct. 15, 2002A. SaekiMicrometermicrometers
6,505,414Jan. 14, 2003Y. FujikawaComparatorcomparators
6,519,867Feb. 18, 2003A. SaekiMeasuring Devicemeasurement gauges
6,782,635Aug. 31, 2004F.J. Cappiello, Sr.Measurement Gauge Having Extensionsmeasurement gauges
7,013,576Mar. 21, 2006Y. Hashimoto, M. Okamoto, T. Nakamura, M. Tachikake, T. Nakadoi, M. Suzuki, S. Takahashi, O. Saito, Y. Ichikawa, K. Sasaki, S. HayashidaMeasuring Device Using Multi-Start Threaded Spindlemeasurement gauges
7,043,852May 16, 2006Y. Ichikawa, Y. Fujikawa, S. Hayashida, T. Omori, Y. Hashimoto, T. Nakamura, N. Hayashi, O. SaitoMeasuring Instrumentmeasurement gauges
7,111,413Sep. 26, 2006W. SeiboldPrecision Distance-Measuring Instrumentmeasurement gauges
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