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US Patent: 2,746,158
Taper Micrometer
Patentee:
George L. Gershman (exact or similar names) - Worcester, MA

USPTO Classifications:
33/532, 33/828

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers
layout tools : taper gauges

Assignees:
T. M. Electronics, Inc. - Boylston, MA

Manufacturer:
Taper Micrometer Corp. - Worcester, MA

Witnesses:
none listed

Patent Dates:
Applied: Jun. 24, 1954
Granted: May 22, 1956

Patent Pictures: [ 1 | 2 ]
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Description:
Examples of this sine-bar-and-micrometer taper gauge are uncommon but do occasionally turn up. It was made in at least four sizes. The examples we have seen are in a box labeled, "Taper Micrometer Corporation / Division of T. M. Electronics, Inc. / 100 Grove Street / Worcester, Massachusetts". See also patents 3,230,630 and 3,327,399.

The inventor died 2008-07-20 at age 100. The Worcester Telegram's obituary of him, from August 2, reveals him to have led an interesting life. He was born in Ukraine in 1908. In the late 1940s he used his mattress manufacturing business to smuggle small arms to Israel. He was also an inventor, pilot, nudist, dowser, bee-keeper, philatelist, hypnotist, and watch repairman.

Abstract:

A principal object of the present invention resides in the provision of a micrometer which includes a frame by which it may be handled having at an end thereof a boss or cylinder for the adjustable reception of an anvil or the like for use as a base-point in the measurement to be read and at the other end thereof said frame is provided with a more or less conventional micrometer thimble and scale directly readable in thousandths of an inch or similar measurement, said thimble being engageable -with a sine bar which is pivoted to the frame and forms and measures an angle with the anvil aforesaid, the taper of the object being measured being readable in thousandths of an inch or otherwise according to shop practice wherein tapers are usually specified as in thousandths of an inch of similar measurement.

Claim:

precision taper micrometer comprising a frame, a trig metrical sine bar pivoted thereon having contact points for engagement with one side of the tapered device to be measured and having a cylindrical sine bar roll whose central axis is parallel to the pivot axis of the sine bar, a direct reading adjustable increment measuring device having a flat face engaging the sine bar roll on the cylindrical surface thereof, and a base member carried by the frame and spaced from~ the sine bar for contacting the article to be measured on the opposite side from the sine bar, said increment measuring device being rectilinearly movable to position the sine bar for the purpose of providing the desired measurement, said contact points on the sine bar being in a line parallel to a plane passing through the central axis of the sine bar roll and the pivot axis of the sine bar.

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