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Patent number:
Patent Date:
US Patent: 527,581
Micrometer Scale
Patentee:
John D. Benson (
exact
or
similar
names) - Brooklyn, NY
USPTO Classifications:
33/562
Tool Categories:
layout tools
:
measurement gauges
rules
Assignees:
None
Manufacturer:
Not known to have been produced
Witnesses:
E. B. Washburn
Leonard N. Vaughan
A. J. Tanner
M. L. Hirchchiffe
Patent Dates:
Applied:
Dec. 27, 1892
Granted:
Oct. 16, 1894
Patent Pictures:
USPTO
(New site tip)
Google Patents
Report data errors or omissions to steward Joel Havens
Description:
George D. Phillips - patent attorney
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