US Patent: 5,421,101
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Dedicated Crimp Measuring Device
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Patentee:
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James S. Rank (exact or similar names) - Lincoln Park, MI |
Manufacturer: |
Not known to have been produced |
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Patent Dates:
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Applied: |
Apr. 14, 1994 |
Granted: |
Jun. 06, 1995 |
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Joel Havens
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Description: |
Laura M Slenzak - patent attorney
Abstract
The measurement tool of the present invention includes a movable spindle and an anvil between which the object to be measured is placed. The anvil is formed to have opposing sloping edges leading to an anvil measurement apex, and the spindle is formed to have first and second measurement sites, where the first measurement site includes a conical portion of the spindle having a spindle measurement apex, and where the second measurement site includes a block portion of the spindle having a generally flat surface aligned generally tangential to the anvil measurement apex.
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