US Patent: 4,168,575
|
| Constant Pressure Measuring Micrometer
|
|
Patentees:
|
| Iwao Sugizaki (exact or similar names) - Kawasaki, Japan |
| Mineo Yamauchi (exact or similar names) - Kawasaki, Japan |
| Manufacturer: |
| Not known to have been produced |
|
|
Patent Dates:
|
| Applied: |
Oct. 21, 1977 |
| Granted: |
Sep. 25, 1979 |
USPTO (New site tip)
Google Patents
Report data errors or omissions to steward
Joel Havens
|
|
Description: |
| Brisebois & Kruger - patent attorneys
Abstract
The present invention relates to a micrometer constituted such that an anvil is supported on a frame by means of parallel leaf springs so that the displacement of said anvil may be magnified and transmitted by a sector gear to a pointer; and said leaf spring is urged toward the spindle by another spring.
|
|
