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US Patent: 4,062,120
Digital Electronic Micrometer
Patentees:
John M. Lacagnina (exact or similar names) - Henrietta, NY
Ernest G. Weber (exact or similar names) - Fairport, NY
Bruce R. Robinson (exact or similar names) - Penfield, NY

USPTO Classifications:
33/819, 33/820

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
Quality Measurement Systems, Inc. - Rochester, NY

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Jun. 10, 1976
Granted: Dec. 13, 1977

Patent Pictures:
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Description:
Stonebraker, Shepard & Stephens - patent attorneys

Abstract

A digital electronic micrometer eliminates backlash and other error between a movable probe and a digital readout and arranges all the working components within a handle thermally insulated from the probe and the yoke. An optical scale is secured to the probe to move directly with the probe past an electro-optical reader arranged within the tool handle, and a manually operable retractor moves the probe away from the anvil against the bias of a spring. Electronic circuitry and digital display can also be arranged in the tool handle for indicating positions of the probe relative to the frame, and the circuitry includes manually actuatable hold circuitry for maintaining the display at an indication of a previous position of the probe after movement of the probe. This allows the tool to be moved to an orientation for observing a measurement previously taken when the tool was in a position obscuring the reading. The circuitry also preferably includes error detection circuitry responsive to change of state of a signal from the reader at more than a predetermined rate or to movement of the probe during actuation of the hold circuitry for energizing an error indicator.

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