|
Description: |
| Joseph P. Lavigne owned the Lavigne Micrometer Co. of New Haven, CT.
My invention relates to an improvement in micrometer gages, the object being to produce a simple, durable, and accurate instrument, adapted to be readily converted into a depth-gage, and constructed to reduce the factor of wear in use to the minimum.
Having fully described my invention, what I claim as new, and desire to secure by Letters Patent, is:
1. A micrometer gage having a graduated beam, a measuring member located therein and adapted to be reciprocated, means for locking the said member against rotation, a measuring screw entered into the beam, a non-rotatable coupling-screw passing through the measuring screw and entering the outer end of the measuring member which it couples with the measuring-screw, and a graduated sleeve connected with the measuring-screw for rotating the same, and fitting over the beam to co-operate with the graduations there of, substantially as set forth.
2. A micrometer-gage having a non-rotatable measuring member constructed with a longitudinal groove, a measuring-screw for operating the same, a key entering the said groove to prevent the said member from rotating, and an adjusting-screw engaging with the outer end of the said key, substantially as described.
3. A micrometer-gage having a non-rotatable measuring member constructed with a longitudinal groove, a key entering the said groove to hold the said member against rotation, a measuring-screw for operating the said member, and a non-rotatable coupling-screw for coupling the said measuring-screw and head together, substantially as described, and whereby the said member is moved back and forth by the said measuring-screw.
4. A micrometer gage having a graduated beam, a measuring sleeve applied to the outer face thereof, a measuring-screw located within the beam and connected with the said sleeve, and a non-rotatable measuring plunger connected with the inner end of the said screw, substantially as described.
5. A micrometer gage having a beam furnished with graduations, a measuring sleeve located thereupon, a measuring-screw located within the beam and connected with the said sleeve, a non-rotatable measuring plunger located within the said sleeve and a non-rotatable coupling-screw connecting the said plunger and measuring-screw, substantially as described.
6. A micrometer gage having a beam provided with graduations, a measuring-sleeve mounted thereupon, a measuring - screw located within the beam and connected with the said sleeve, a non-rotatable measuring plunger also located within the beam, a non-rotatable coupling-screw passing through the measuring-screw and into the outer end of the plunger, and a spring interposed between the said coupling and measuring-screws, and arranged to draw the measuring-screw and plunger together, substantially as described.
7. In a micrometer-gage, the combination with the frame thereof, of measuring devices applied thereto, and including a longitudinally movable measuring member or part, and a removable depth plug, the said measuring member or part being constructed at its outer end to have the inner end of the said plug temporarily connected with it, and the said plug being constructed to project beyond the said frame, substantially as described, and whereby the plug partakes of the movement of the said member.
8. In a micrometer-gage, the combination with the frame thereof, of measuring devices applied thereto and including a measuring screw and a non-rotatable measuring plunger connected therewith, and partaking of the longitudinal movement thereof; and a removable depth plug, the outer end of the said plunger being constructed to have the inner end of the depth plug temporarily connected with it, and the said plug being constructed to project beyond the frame of the instrument, substantially as described, and whereby the plug partakes of the movement of the plunger.
9. In a micrometer-gage, the combination with the frame thereof, of measuring devices, including a measuring-screw, and a non-rotatable measuring plunger connected therewith, and partaking of the longitudinal movement thereof, and having a central longitudinal bore, an anvil constructed with a central longitudinal opening mounted in the said frame, and a removable depth plug constructed to be passed through the said anvil, and entered at its inner end into the bore formed in the said plunger, while its outer end projects through the anvil beyond the frame, substantially as set forth, and whereby the said plug partakes of the movement of the plunger.
10. In a micrometer gage, the combination with a measuring plunger having its outer end counter-bored, and an anvil constructed with a central longitudinal opening, of a removable depth plug having its inner end split and adapted to be passed through the opening of the anvil and into the counter-bore of the plunger, substantially as described.
11. In a micrometer-gage, the combination with the frame thereof, of measuring devices applied thereto and including a measuring screw and a non-rotatable measuring plunger connected therewith and partaking of the longitudinal movement thereof, and having a central longitudinal bore and a dust pocket located within the same, an anvil mounted in the frame, and having a central longitudinal opening located in line with the bore of the plunger, and a removable depth plug constructed to have its inner end temporarily inserted into the bore of the plunger, and to pass through the opening in the anvil and project beyond the frame, substantially as set forth.
12. In a micrometer-gage, the combination with a frame provided at its outer end with a flat face, and a foot, both located at a right angle to its plane, of measuring devices applied to the said frame, and including a longitudinally movable measuring member, and a removable depth plug constructed to be temporarily connected with the outer end of the said member, and to project beyond the outer end of the frame, at a right angle with the said face and foot which support the frame while the instrument is being used as a depth gage, substantially as described. |
|
){kind=link}
){kind=link}
){kind=link}