US Patent: 661,562 - Measuring Gage


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US Patent: 661,562

Measuring Gage

Patentee:

Laroy S. Starrett (exact or similar names) - Athol, MA

USPTO Classifications:

285/323, 33/783

Tool Categories:

Assignees:

None

Manufacturer:

Not known to have been produced

Witnesses:

Frank E. Wing

Willard G. Nims

Patent Dates:
Applied:	May 19, 1899
Granted:	Nov. 13, 1900

Patent Pictures:

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Description:

Micrometer type gage for use in dark locations or anywhere use of a conventional micrometer would require the spindle to be moved, changing the measurement.