US Patent: AI247 - Measurement of solar altitude


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US Patent: AI247

Measurement of solar altitude

Patentee:

Frederick Yeiser (exact or similar names) - Lexington, KY

USPTO Classifications:

33/268

Tool Categories:

specialty tools : surveying apparatus

Assignees:

None

Manufacturer:

Frederick Yeiser - Lexington, KY

Sturm, Steffens & Co. - Indianapolis, IN

John Hougham - Franklin, IN

Witnesses:

Unknown

Patent Dates:
Granted:	Aug. 09, 1859

Patent Pictures:

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Description:

This patent is an additional improvement on patent 22,913. Additional Improvement" patents were issued between 1836 and 1860 to allow patentees an easier way to make additional claims, improvements or clarifications. See patent AI289 for a subsequent Additional Improvement.