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US Patent: 5,495,677
Digital Display Micrometer Gauge
Patentees:
Masahiko Tachikake (exact or similar names) - Kawasaki, Japan
Masamichi Suzuki (exact or similar names) - Kawasaki, Japan

USPTO Classifications:
33/784, 33/815, 33/819

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
Mitutoyo Corp. - Tokyo, Japan

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Sep. 28, 1994
Granted: Mar. 05, 1996

Patent Pictures:
USPTO (New site tip)
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Report data errors or omissions to steward Joel Havens
Description:
Oliff & Berridge, PLC - patent attorneys

Abstract

A digital display micrometer gauge holds a workpiece to be measured between an anvil and a spindle. An engagement member is provided at an end of the spindle. An inner sleeve having an axial slit into which the engagement member is inserted, is secured to a U-shaped main frame, and an outer sleeve having a spiral groove, which is formed in the inner peripheral section thereof, is provided on the outer periphery of the inner sleeve to be circumferentially rotatable. By rotating this outer sleeve, the spindle can be driven at high speed. A main scale constituting a linear encoder is attached to a side surface of the spindle extending along the axis of the spindle, whereby the displacement amount of the spindle can be detected with high accuracy. A slide member slidable on the inner surface of the inner sleeve is provided at the end of the spindle where the engagement member is provided, and the spindle can be inserted into the inner sleeve together with the main scale attached thereto.

Application filed in Japan, 01 Oct 1993.

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