US Patent: 3,810,310 - Micrometer Measuring Devices


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US Patent: 3,810,310

Micrometer Measuring Devices

Patentee:

Paul A. Morgan (exact or similar names) - Chicago, IL

USPTO Classifications:

33/816, 33/819, 40/518, 74/441

Tool Categories:

metalworking tools : machinist tools : measuring tools : micrometers

Assignees:

Century Wheels, Inc. - Lake Bluff, WI

Manufacturer:

Not known to have been produced

Witnesses:

none listed

Patent Dates:
Applied:	Mar. 27, 1972
Granted:	May 14, 1974

Patent Pictures:

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Description:

Sheldon Landsman - patent attorney

Abstract

A micrometer comprises a frame having a first reference means, a spindle mounted in the frame for axial movement and having a threaded section, a control nut extending partially around a longitudinal portion of the threaded section of the spindle and having threads mating with those of the spindle, and means for positioning the control nut at a set longitudinal distance from the first reference means. Resilient force applying means acts transverse to the axis of the spindle to continuously urge the mating threads of the spindle and control nut into tight engagement with each other to maintain the roots and crests of the spindle in continuous alignment with the roots and crests of the control nut and provide for accurate readings of the micrometer.