US Patent: 5,489,168
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Metrology Instrument Arm System
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Patentees:
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Paul C. Sheldon (exact or similar names) - Mequon, Ozaukee County, WI |
Edward E. Kirkham (exact or similar names) - Brookfield, Waukesha County, WI |
Lyle D. Ostby (exact or similar names) - West Allis, Milwaukee County, WI |
Bruce P. Konkel (exact or similar names) - Muskego, Waukesha County, WI |
Manufacturer: |
Not known to have been produced |
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Patent Dates:
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Applied: |
Oct. 11, 1994 |
Granted: |
Feb. 06, 1996 |
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Joel Havens "Vintage Machinery" entry for Giddings & Lewis Manufacturing Co.
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Description: |
This is a continuation of U.S. patent application filed on 20 Feb., 1992, now U.S. Pat. No. 5,345,158 which is a continuation-in-part of U.S. Pat. No. 5,028,180 filed on 01 Sept., 1989.
Abstract:
The present invention relates generally to a metrology framework for determining the position of a first object, such as an operator, relative to a second object when the first object is moved relative to the second object. The metrology framework comprises a plurality of extensible instrument arms that are operatively connected in proximity to the first object and the second object. A sensor is in communication with each extensible instrument arm to provide a signal indicative of the extension of the instrument arm. The combination of the signals can be used to determine the position of the first object relative to the second object in all six degrees of freedom. |
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