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Patent number:
Patent Date:
US Patent: 1,335,004
Micrometer and Height Gage
Patentee:
Daniel H. Lehigh (
exact
or
similar
names) - Chicago, Cook County, IL
USPTO Classifications:
33/824
Tool Categories:
metalworking tools
:
machinist tools
:
measuring tools
:
micrometers
metalworking tools
:
machinist tools
:
measuring tools
:
height gages
Assignees:
Daniel H. Lehigh
- Chicago, Cook County, IL
Homer J. Richer
- Chicago, Cook County, IL
Manufacturer:
Not known to have been produced
Witnesses:
Unknown
Patent Dates:
Applied:
Mar. 19, 1919
Granted:
Mar. 30, 1920
Patent Pictures:
USPTO
(New site tip)
Google Patents
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