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US Patent: 2,704,403
Combined Micrometer and Depth Gauge
Patentee:
Sarafim Sawijalow (exact or similar names) - Brooklyn, NY

USPTO Classifications:
33/709, 33/828

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
None

Manufacturer:
Not known to have been produced

Witnesses:
none listed
Patent Dates:
Applied: Feb. 19, 1953
Granted: Mar. 22, 1955

Patent Pictures:
USPTO (New site tip)
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Report data errors or omissions to steward Joel Havens
Description:
Cornelius Falus Rie - patent attorney

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