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US Patent: 3,602,998
Micrometer Head
Patentees:
Keikichi Imai (exact or similar names) - Tokyo, Japan
Sakuzo Matsumoto (exact or similar names) - Tokyo, Japan

USPTO Classifications:
33/556

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
Olympus Optical Co., Ltd. - Tokyo, Japan

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Dec. 03, 1968
Granted: Sep. 07, 1971

Patent Pictures:
USPTO (New site tip)
Google Patents
Report data errors or omissions to steward Joel Havens
Description:
Otto John Munz - patent attorney

Abstract

A micrometer head capable of adjusting the starting zero point of the graduations for a measurement. A graduated ring is manually rotatable relative to a thimble for the zero adjustment of the graduations at any axial position of the spindle. An indicating ring is rotatably mounted in the micrometer head and bears thereon graduations. The indicating ring is so coupled operatively with the spindle by guide means that the indicating ring is rotatably moved by one pitch of the graduations thereon as the spindle is rotated by one revolution. The indicating ring is further manually rotatable relative to the micrometer head regardless of the axial position of the spindle so that the zero adjustment of the graduations on the indicating ring is effected at any axial position of the spindle while the indicating ring is rotatably moved in conjunction with the rotation of the spindle during the normal measuring operation of the micrometer head.

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