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US Patent: 3,222,790
Measuring Instrument
Patentee: Hans Meyer (exact or similar names) - Vaud, Switzerland USPTO Classifications: 33/818, 33/827 Tool Categories: layout tools : measurement gauges Assignees: None Manufacturer: Not known to have been produced Witnesses: none listed	Patent Dates: Applied: Feb. 11, 1964 Granted: Dec. 14, 1965 Patent Pictures: USPTO (New site tip) Google Patents Report data errors or omissions to steward Joel Havens
Description: Emory L. Groff Jr. - patent attorney Application in Switzerland 08 Mar 1963.

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