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US Patent: 607,898
Micrometer Gage
Patentee: Vernon C. Todd (exact or similar names) - St. Louis, MO USPTO Classifications: 33/802 Tool Categories: metalworking tools : machinist tools : measuring tools : thickness gages Assignees: Edwin H. Ehrler - St. Louis, MO Manufacturer: Not known to have been produced Witnesses: G. A. Pennington Ralph Kalish Hugh K. Wagner	Patent Dates: Applied: Oct. 27, 1897 Granted: Jul. 26, 1898 Patent Pictures: USPTO (New site tip) Google Patents Report data errors or omissions to steward Joel Havens
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