| Patents for Mitutoyo Corp. |
Patents 1 -
15
of 15
      |
| Number | Date | Patentee | Title | Type |
| 5,433,016 | Jul. 18, 1995 | T. Nakadoi, A. Fujimaru, M. Tachikake | Linear Displacement Measuring Apparatus | measurement gauges |
| 5,477,621 | Dec. 26, 1995 | T. Suzuki, T. Shirai, H. Koizumi | Electrical Capacitance Instrument and Manufacturing Method of the Same | measurement gauges |
| 5,495,677 | Mar. 05, 1996 | M. Suzuki, M. Tachikake | Digital Display Micrometer Gauge | micrometers |
| 5,829,155 | Nov. 03, 1998 | M. Tachikake, M. Suzuki, S. Takahashi | Micrometer | micrometers |
| 5,920,198 | Jul. 06, 1999 | S. Takahashi, M. Suzuki | Capacitance-Type Displacement Measuring Device | measurement gauges |
| 6,115,934 | Sep. 12, 2000 | T. Fujimitsu, T. Mishima, C. Hamano, K. Nakata, H. Sato | Micrometer, Method for Manufacturing Cylindrical Component for Micrometer | micrometers |
| 6,176,021 | Jan. 23, 2001 | T. Fujimitsu, T. Mishima, C. Hamano, K. Nakata, H. Sato | Micrometer | micrometers |
| 6,178,658 | Jan. 30, 2001 | S. Koga | Micrometer | micrometers |
| 6,260,286 | Jul. 17, 2001 | S. Takahashi, S. Hayashida, M. Suzuki | Micrometer | micrometers |
| 6,308,433 | Oct. 30, 2001 | M. Tachikake, K. Sasak, S. Hayashida, T. Otsuka, T. Nakadoi, S. Takahashi | Micrometer that Holds Displayed Displacement when Retraction Amount is Less than a Set Amount | micrometers |
| 6,463,671 | Oct. 15, 2002 | A. Saeki | Micrometer | micrometers |
| 6,505,414 | Jan. 14, 2003 | Y. Fujikawa | Comparator | comparators |
| 6,519,867 | Feb. 18, 2003 | A. Saeki | Measuring Device | measurement gauges |
| 7,013,576 | Mar. 21, 2006 | S. Takahashi, O. Saito, Y. Ichikawa, K. Sasaki, S. Hayashida, Y. Hashimoto, M. Okamoto, T. Nakamura, M. Tachikake, T. Nakadoi, M. Suzuki | Measuring Device Using Multi-Start Threaded Spindle | measurement gauges |
| 7,043,852 | May 16, 2006 | T. Omori, Y. Hashimoto, T. Nakamura, N. Hayashi, O. Saito, Y. Ichikawa, Y. Fujikawa, S. Hayashida | Measuring Instrument | measurement gauges |
