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Patents for Mitutoyo Corp.
Patents 1 - 14 of 14
First set of recordsLast set of records
NumberDatePatenteeTitleType
5,433,016Jul. 18, 1995T. Nakadoi, .  Fujimaru, M. TachikakeLinear Displacement Measuring Apparatusmeasurement gauges
5,477,621Dec. 26, 1995T. Suzuki, T. Shirai, H. KoizumiElectrical Capacitance Instrument and Manufacturing Method of the Samemeasurement gauges
5,495,677Mar. 05, 1996M. Suzuki, M. TachikakeDigital Display Micrometer Gaugemicrometers
5,829,155Nov. 03, 1998M. Tachikake, M. Suzuki, S. TakahashiMicrometermicrometers
5,920,198Jul. 06, 1999M. Suzuki, . TakahashiCapacitance-Type Displacement Measuring Devicemeasurement gauges
6,115,934Sep. 12, 2000T. Fujimitsu, T. Mishima, C. Hamano, K. Nakata, H. SatoMicrometer, Method for Manufacturing Cylindrical Component for Micrometermicrometers
6,176,021Jan. 23, 2001T. Fujimitsu, T. Mishima, C. Hamano, K. Nakata, H. SatoMicrometermicrometers
6,178,658Jan. 30, 2001S. KogaMicrometermicrometers
6,260,286Jul. 17, 2001S. Takahashi, S. Hayashida, M. SuzukiMicrometermicrometers
6,308,433Oct. 30, 2001M. Tachikake, K. Sasak, S. Hayashida, T. Otsuka, T. Nakadoi, S. TakahashiMicrometer that Holds Displayed Displacement when Retraction Amount is Less than a Set Amountmicrometers
6,505,414Jan. 14, 2003Y. FujikawaComparatormeasurement gauges
6,519,867Feb. 18, 2003A. SaekiMeasuring Devicemeasurement gauges
7,013,576Mar. 21, 2006Y. Hashimoto, M. Okamoto, T. Nakamura, M. Tachikake, T. Nakadoi, M. Suzuki, S. Takahashi, O. Saito, Y. Ichikawa, K. Sasaki, S. HayashidaMeasuring Device Using Multi-Start Threaded Spindlemeasurement gauges
7,043,852May 16, 2006Y. Hashimoto, T. Nakamura, N. Hayashi, O. Saito, Y. Ichikawa, Y. Fujikawa, S. Hayashida, T. OmoriMeasuring Instrumentmeasurement gauges
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