| All Patents in class 33/831 |
Patents 31 -
39
of 39
      |
| Number | Date | Patentee | Title | Type |
| 6,260,286 | Jul. 17, 2001 | S. Takahashi, S. Hayashida, M. Suzuki | Micrometer | micrometers |
| 6,308,433 | Oct. 30, 2001 | M. Tachikake, K. Sasak, S. Hayashida, T. Otsuka, T. Nakadoi, S. Takahashi | Micrometer that Holds Displayed Displacement when Retraction Amount is Less than a Set Amount | micrometers |
| 6,463,671 | Oct. 15, 2002 | A. Saeki | Micrometer | micrometers |
| 6,505,414 | Jan. 14, 2003 | Y. Fujikawa | Comparator | comparators |
| 6,519,867 | Feb. 18, 2003 | A. Saeki | Measuring Device | measurement gauges |
| 6,782,635 | Aug. 31, 2004 | F.J. Cappiello, Sr. | Measurement Gauge Having Extensions | measurement gauges |
| 7,013,576 | Mar. 21, 2006 | Y. Hashimoto, M. Okamoto, T. Nakamura, M. Tachikake, T. Nakadoi, M. Suzuki, S. Takahashi, O. Saito, Y. Ichikawa, K. Sasaki, S. Hayashida | Measuring Device Using Multi-Start Threaded Spindle | measurement gauges |
| 7,043,852 | May 16, 2006 | T. Omori, Y. Hashimoto, T. Nakamura, N. Hayashi, O. Saito, Y. Ichikawa, Y. Fujikawa, S. Hayashida | Measuring Instrument | measurement gauges |
| 7,111,413 | Sep. 26, 2006 | W. Seibold | Precision Distance-Measuring Instrument | measurement gauges |
