| All Patents in class 33/820 |
Patents 1 -
12
of 12
      |
| Number | Date | Patentee | Title | Type |
| 2,933,816 | Apr. 26, 1960 | R.E. Gunther | Micrometer Calipers | micrometers |
| 3,877,149 | Apr. 15, 1975 | M. Masuda | Accuracy Regulating Means for a Linear Micrometer | micrometers |
| 3,924,336 | Dec. 09, 1975 | K. Inoue | Measuring Instrument | measurement gauges |
| 4,062,120 | Dec. 13, 1977 | E.G. Weber, J.M. Lacagnina, B.R. Robinson | Digital Electronic Micrometer | micrometers |
| 4,070,760 | Jan. 31, 1978 | U. Roth, L. Roth | Micrometer | micrometers |
| 4,103,427 | Aug. 01, 1978 | R.E. Ledley, III | Electronic Digital Micrometer | micrometers |
| 4,207,679 | Jun. 17, 1980 | M.L. Poage | Micrometer | micrometers |
| 4,255,861 | Mar. 17, 1981 | H. Suwa, K. Nakata | Electrically Digital Display Micrometer | micrometers |
| 4,437,241 | Mar. 20, 1984 | J.H. Lemelson | Measuring Instrument and Method | measurement gauges |
| 5,433,016 | Jul. 18, 1995 | T. Nakadoi, . Fujimaru, M. Tachikake | Linear Displacement Measuring Apparatus | measurement gauges |
| 7,013,576 | Mar. 21, 2006 | Y. Hashimoto, M. Okamoto, T. Nakamura, M. Tachikake, T. Nakadoi, M. Suzuki, S. Takahashi, O. Saito, Y. Ichikawa, K. Sasaki, S. Hayashida | Measuring Device Using Multi-Start Threaded Spindle | measurement gauges |
| 7,111,413 | Sep. 26, 2006 | W. Seibold | Precision Distance-Measuring Instrument | measurement gauges |
