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US Patent: 5,433,016
Linear Displacement Measuring Apparatus
Patentees:
Masahiko Tachikake (exact or similar names) - Kawasaki, Japan
Akio  Fujimaru (exact or similar names) - Kawasaki, Japan
Tetsuya Nakadoi (exact or similar names) - Higashihiroshima, Japan

USPTO Classifications:
33/703, 33/820

Tool Categories:
layout tools : measurement gauges

Assignees:
Mitutoyo Corp. - Tokyo, Japan

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Dec. 22, 1993
Granted: Jul. 18, 1995

Patent Pictures:
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Description:
Flynn, Thiel, Boutell & Tanis - patent attorneys

Abstract

A linear displacement measuring apparatus in which a spindle is disposed movably forwardly and backwardly to a measuring apparatus main body, a detector for detecting a linear displacing amount of the spindle is disposed to the inside of the measuring apparatus main body and a water-proof mechanism is disposed to a liquid intruding path in communication with the detector for preventing liquid from intruding.

Application filed in Japan, 24 Dec 1992.

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