US Patent: 5,463,818
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Wide-Width Micrometer and Method of Using the Same
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Patentee:
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Charles H. Hughes (exact or similar names) - Poland, OH |
Manufacturer: |
Not known to have been produced |
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Patent Dates:
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Applied: |
Mar. 30, 1994 |
Granted: |
Nov. 07, 1995 |
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Joel Havens
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Description: |
Kane, Dalsimer, Sullivan, Kurucz, Levy, Eisele and Richard - patent attorneys
Abstract
A device for measuring a dimension of an object includes a platform with a contact surface and a measuring device. An object to be measured is placed on the platform between the contact surface and the measuring device and held flat by a clamping wedge. In order to obtain a variance of said dimension with respect to a nominal value, a standard having a known length is first placed on the platform and the measuring device is calibrated using the standard.
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