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Patent number:
Patent Date:
US Patent: 3,233,330
Micrometer for Inner Measurements
Patentee:
Chi Liang Cho (
exact
or
similar
names) - Zurich, Switzerland
USPTO Classifications:
33/544.6
Tool Categories:
metalworking tools
:
machinist tools
:
measuring tools
:
micrometers
Assignees:
None
Manufacturer:
Not known to have been produced
Witnesses:
none listed
Patent Dates:
Applied:
Nov. 29, 1961
Granted:
Feb. 08, 1966
Patent Pictures:
USPTO
(New site tip)
Google Patents
Report data errors or omissions to steward Joel Havens
Description:
Wenderoth, Lind & Ponack - patent attorneys
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