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US Patent: 4,168,575
Constant Pressure Measuring Micrometer
Iwao Sugizaki - Kawasaki, Japan
Mineo Yamauchi - Kawasaki, Japan

USPTO Classifications:
33/816, D10/73

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Kabushiki Kaisha Mitutoyo Seisakusho - Tokyo, Japan

Not known to have been produced

none listed

Patent Dates:
Applied: Oct. 21, 1977
Granted: Sep. 25, 1979

Patent Pictures:
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The present invention relates to a micrometer constituted such that an anvil is supported on a frame by means of parallel leaf springs so that the displacement of said anvil may be magnified and transmitted by a sector gear to a pointer; and said leaf spring is urged toward the spindle by another spring.

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