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US Patent: 3,924,336
Measuring Instrument
Patentee:
Kiyoshi Inoue (exact or similar names) - Tokyo, Japan

USPTO Classifications:
33/819, 33/820

Tool Categories:
layout tools : measurement gauges

Assignees:
Inque-Japax Research (Ijr) Inc. - Yokohamashi, Japan

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Mar. 22, 1974
Granted: Dec. 09, 1975

Patent Pictures:
USPTO (New site tip)
Google Patents
Report data errors or omissions to steward Joel Havens
Description:
Karl F. Ross - patent attorney

Abstract

A measuring instrument comprising body member having a first surface and a second surface movable relatively to said first surface, an electro-optical display mounted on said body member for displaying a distance between said surfaces measured in numeric form, a transducer responsive to the relative movement between said surfaces for producing pulses representative of the distance travelled in said relative movement, and a large-scale integrated circuit mounted on said body member, said integrated circuit including at least a portion of said transducer, an up-down counter coupled to said transducer for receiving the output pulses thereof and a decoder driver coupling the output of said up-down counter to said electro-optical display for digitally signalling said distance measured.

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