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US Patent: 3,727,318
Micrometer Apparatus
Patentee:
Johann Meier (exact or similar names) - Minusio, Switzerland

USPTO Classifications:
33/814

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
None

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Oct. 26, 1970
Granted: Apr. 17, 1973

Patent Pictures:
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Description:
Lawrence E. Laubscher - patent attorney

Abstract

Micrometer apparatus for accurately measuring and indicating distance, including a vernier casing rotatably mounted concentrically about a cylindrical micrometer head, a follower member arranged for coaxial reciprocatory movement relative to said micrometer head, and actuator means connected with said vernier casing for effecting longitudinal displacement of said follower member relative to said micrometer body. The invention is characterized in that the actuator means includes first and second screw thread means of different pitch and thread direction for connecting the vernier casing with the micrometer body and with the follower, respectively. In accordance with a modification of the invention, the micrometer head is connected with a housing that supports a gauge pin mounted for axial sliding movement in a direction parallel with the actuator axis, a scale plate being carried by said gauge pin. The follower member is operable to displace a reader marker relative to said scale plate to afford a vernier reading of the position of the qauge pin relative to the housing.

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