US Patent: 271,401
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| Micrometer Indicating Gage
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Patentee:
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| Merrick M. Barnes (exact or similar names) - Boston, MA |
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Patent Dates:
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| Applied: |
Nov. 03, 1882 |
| Granted: |
Jan. 30, 1883 |
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Patent Pictures:
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1 | 2
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Russ Allen
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Description: |
| Micrometer with adjustable beam to allow it to be used for measuring much larger items. Design is such that it allows rapid checking of items against a set thickness so that when an item is the correct size both the mark on the indicating arm and the mark on the beam will coincide.
A sample appeared on one of Patrick Leach's tool lists. It was marked with this patent date and July 3, 1883 for Barnes' 280,339 |
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